IEESD 2013: The 5th International IEEE Workshop on Industrial Experience in Embedded Systems Design

Held in conjunction with COMPSAC, the IEEE Signature Conference on Computers, Software & Applications - July 22-26, 2013 - Kyoto, Japan


Goal of the Workshop

The development of systems (software and hardware) in the industrial domain is facing a continuously growing technical environment. The integration of embedded systems in such a complex sphere, the interaction of embedded systems with the environment as well as with any other arbitrary (embedded and non-embedded) systems are major questions in the design and development of large industrial systems (system-of-systems). Such technical systems range from small embedded devices up to PC-class systems and their specific requirements for the development of software have to be aligned with the need to keep up with the quality of the system over many development iterations and throughout the massive expansion of the potentially collaborating system of embedded systems. The complexity of such huge interrelated and networked embedded systems is not yet fully supported by current development methods/processes with their technologies and accompanying tools. There are still gaps in the different development phases as well as modeling concepts for large systems as mentioned above. Dynamic traceability information starting with the requirements going into the running systems needs to be enhanced to reach a better and online analysis of the quality of such complex technical systems. The design of such huge and interrelated systems becomes even more important with the need of e.g. an early simulation for an early prediction of possible failures and bottlenecks.

The theme of this workshop is to continuously gather current requirements of complex technical systems which are highly interrelated and embedded in a complex environment. We need to analyze the environments and the possible abstractions of such environments, e. g. towards an early and highly accurate simulation of embedded system designs. Different beneficial approaches for assessing and modeling such complex embedded systems are needed and will foster the application and further development of scientific approaches in the domain of large, interrelated and networked technical systems.

Papers are expected to cover (non-restrictively) one or more of the following topics:
• Experience reports with complex embedded technical systems out of different domains
• Model-Driven Development for complex embedded systems
• Product Lines Architectures, Software Architectures for complex embedded systems
• Testing of complex embedded Systems
• Evaluation and Analysis of Software Architectures
• Adaptable, Evolvable Software and Hardware Architectures, Execution Models and Runtime Platforms
• Development Methods, Processes and Tools for complex embedded Systems
• Networking Environments
• Coupling of Devices and Enterprise Applications


Papers must be submitted electronically via the IEESD 2013 Submission Page.

Follow the IEEE Computer Society Press Proceedings Author Guidelines to prepare your papers:

All papers will be carefully reviewed by at least three reviewers. Papers can be submitted as regular papers (six pages), and the acceptance will depend on reviewer feedback. Accepted papers will be published in the workshop proceedings of the IEEE Computer Software and Applications Conference (COMPSAC 2013) by the IEEE CS Press. At least one of the authors of each accepted paper must register as a full participant of the workshop to have the paper published in the proceedings. Each accepted paper must be presented in person by an author.

General Inquiries

For updated information, please contact the workshop organizers.

IEESD Organizers

Detlef Streitferdt
Ilmenau University of Technology, Germany Email: detlef.streitferdt (at)

Tiberiu Seceleanu
ABB Corporate Research, Sweden Email: tiberiu.seceleanu (at)

Philipp Nenninger
ABB Corporate Research, Germany
Email: philipp.nenninger (at)

Program Committee

Tughrul Arslan, University of Edinburgh, UK
Jerker Delsing, Lulea University of Technology, Sweden
Robert Eschbach, Fraunhofer IESE, Germany
Manal A. Farrag, Prince Sultan University, Saudi Arabia
Stefan Gerken, Siemens, Germany
Mikael Gidlund, ABB CRC, Sweden
Michael C. Jδger, Siemens, Germany
Stamatis Karnouskos, SAP, Germany
Stephan Pietsch, TestingTech, Germany
Ghulam Rasool, CIIT Lahore, Pakistan
Matthias Riebisch, University of Hamburg, Germany
Bernhard Schatz, Technical University Munich, Germany
Cristina Seceleanu, Malardalen University, Sweden
Dragos Truscan, Abo Akademi, Finland
Philipp Vorst, ABB Corporate Research, Germany

Workshops Program Deadlines

• Extended: April 8, 2013 : Workshop papers due
• April 26, 2013: Workshop paper notifications
• May 5, 2013: Camera-ready copy and registration due